Transmission electron microscopy
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FEI Tecnai™ G2 Sphera
Transmission electron microscope with a high resolution camera
specifications
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Leica UCT
Microtome equiped with cryo-unit FCS for low temperature sectioning
specifications
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Leica EM AFS
Freeze substitution and low temperature embedding after cryofixation and PLT technique
specifications
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FEI vitrobot cryoplunger
Automated vitrification process to provide fast, easy and reproducible sample preparation for Cryo-TEM.
specifications

Scanning electron microscopy
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JEOL JSM-6510LV
Routine scanning electron microscope
specifications